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Bayern
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Mixed-signal semiconductor test system for post‑silicon verification at Fraunhofer EMFT, Bayern - Frist 07.09.2026
Procurement of a mixed‑signal semiconductor test system for post‑silicon verification, characterization and functional testing of integrated circuits and chiplets, compatible with the existing Advantest V93000 and interfacing with standard wafer probing and device handling equipment at Fraunhofer EMFT.
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Leistungsbeschreibung
Procurement of a mixed‑signal semiconductor test system for post‑silicon verification, characterization and functional testing of integrated circuits and chiplets, compatible with the existing Advantest V93000 and interfacing with standard wafer probing and device handling equipment at Fraunhofer EMFT.
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advantestmixed-signalpost-siliconsemiconductortest systemverification
Id: b23ca3d0-6b2e-450a-9020-01ba836fafae